完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | LEE, CL | en_US |
dc.contributor.author | YANG, WL | en_US |
dc.contributor.author | LEI, TF | en_US |
dc.date.accessioned | 2014-12-08T15:06:00Z | - |
dc.date.available | 2014-12-08T15:06:00Z | - |
dc.date.issued | 1988-04-01 | en_US |
dc.identifier.issn | 0018-9383 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/16.2489 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/4540 | - |
dc.language.iso | en_US | en_US |
dc.title | THE SPREADING RESISTANCE ERROR IN THE VERTICAL KELVIN TEST RESISTOR STRUCTURE FOR THE SPECIFIC CONTACT RESISTIVITY | en_US |
dc.type | Note | en_US |
dc.identifier.doi | 10.1109/16.2489 | en_US |
dc.identifier.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | en_US |
dc.citation.volume | 35 | en_US |
dc.citation.issue | 4 | en_US |
dc.citation.spage | 521 | en_US |
dc.citation.epage | 523 | en_US |
dc.contributor.department | 交大名義發表 | zh_TW |
dc.contributor.department | 電控工程研究所 | zh_TW |
dc.contributor.department | National Chiao Tung University | en_US |
dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
dc.identifier.wosnumber | WOS:A1988M528600019 | - |
dc.citation.woscount | 2 | - |
顯示於類別: | 期刊論文 |