完整後設資料紀錄
DC 欄位語言
dc.contributor.author彭伯倫en_US
dc.contributor.authorPeng, Bo-Lunen_US
dc.contributor.author洪紹剛en_US
dc.contributor.authorHung, Shao-Kangen_US
dc.date.accessioned2014-12-12T01:56:29Z-
dc.date.available2014-12-12T01:56:29Z-
dc.date.issued2011en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#GT079914563en_US
dc.identifier.urihttp://hdl.handle.net/11536/49460-
dc.description.abstract本論文研究一市售石英音叉(Quartz Tuning Fork, QTF)結合鎢探針(Tungsten Probe),構成了一個表面輪廓掃描感測器。該感測器,採用了與TM-AFM(Tapping Mode Atomic Force Microscope)相同的工作原理。接著將介紹此感測器的組成及特性,以證明此感測器的有效性,並可以應用於表面輪廓儀(Surface Profilometer)。zh_TW
dc.description.abstractThis paper presents a commercial quartz tuning fork (QTF) based homemade tungsten probe. The proposed QTF based tungsten probe can be used as a sensor in a surface profilometer, which has the same principle as a tapping-mode atomic force microscope. This study also discusses the characteristics of the proposed sensor and demonstrates its effectiveness.en_US
dc.language.isozh_TWen_US
dc.subject石英音叉zh_TW
dc.subject鎢探針zh_TW
dc.subject表面輪廓儀zh_TW
dc.subjectQuartz tuning forken_US
dc.subjectTungsten probeen_US
dc.subjectProfilometeren_US
dc.title石英音叉鎢探針之設計與特性研究應用於表面形貌量測zh_TW
dc.titleDesign and Characteristic Study of Quartz Tuning Fork Based Tungsten Probe for Surface Profilingen_US
dc.typeThesisen_US
dc.contributor.department機械工程學系zh_TW
顯示於類別:畢業論文