標題: CHARACTERIZATION OF MONOLITHIC POLYCRYSTALLINE-SILICON RESISTORS IN SUB-MICRON THICKNESS
作者: LU, NCC
LU, CY
LEE, MK
SHIH, CC
WANG, CS
SHENG, TT
REUTER, W
交大名義發表
National Chiao Tung University
公開日期: 1982
URI: http://hdl.handle.net/11536/4986
ISSN: 0013-4651
期刊: JOURNAL OF THE ELECTROCHEMICAL SOCIETY
Volume: 129
Issue: 8
起始頁: C331
結束頁: C331
Appears in Collections:Articles