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dc.contributor.authorCHANG, HLen_US
dc.contributor.authorYU, SYen_US
dc.date.accessioned2014-12-08T15:06:30Z-
dc.date.available2014-12-08T15:06:30Z-
dc.date.issued1980en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://hdl.handle.net/11536/5065-
dc.identifier.urihttp://dx.doi.org/10.1063/1.327530en_US
dc.language.isoen_USen_US
dc.titleOBSERVATION OF A POSSIBLE FRINGING FIELD-EFFECT ON THE THRESHOLD VOLTAGE VARIATION OF THE SHORT-CHANNEL MOSFETen_US
dc.typeNoteen_US
dc.identifier.doi10.1063/1.327530en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume51en_US
dc.citation.issue11en_US
dc.citation.spage6037en_US
dc.citation.epage6038en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:A1980KX90100079-
dc.citation.woscount0-
顯示於類別:期刊論文