標題: | BARITT結構的靜態與微波特性 |
作者: | 褚冀良 Chu, Ji-Liang 施敏 Shi, Min 電子研究所 |
關鍵字: | 靜態;微波特性;電子工程;BARITT;BARRIER-INJECTION-ANDTRANSIT-T;PN-JUNCTION-TYPE-STRUCTURE;STATIC-CURRENT-VOLTAGE;CURRENT-TRANSPORT-MECHANISM;ELECTRONIC-ENGINEERING |
公開日期: | 1972 |
摘要: | BARITT stands for Barrier Injection and Transit Time. The BARITT diode is a new class of microwave solid state devices. In this thesis the static and microwave performances of various BARITT structures have been studied theoretically and experimentally. The BARITT diode family includes two types, the Schottky-type structures and the pn junction-type structrues. For the Schottky-type static current-voltage characteristics and small-signal impedance in order to optimize for higher operation efficiency and power output. The four diode structures are mνnp, Mup. MνnνM and MnνM, where M stands for metal and ν for low-doping n type semiconductor. for the pn junction-type BARITT diodes, the current transport mechanisms and the small-signal impedance of reach-through p+np+ and its related structures have also been studied. |
URI: | http://140.113.39.130/cdrfb3/record/nctu/#NT614430001 http://hdl.handle.net/11536/51030 |
顯示於類別: | 畢業論文 |