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dc.contributor.authorTsai, Lin-Tzungen_US
dc.contributor.authorChiu, Shao-Pinen_US
dc.contributor.authorLu, Jia Graceen_US
dc.contributor.authorLin, Juhn-Jongen_US
dc.date.accessioned2014-12-08T15:07:03Z-
dc.date.available2014-12-08T15:07:03Z-
dc.date.issued2010-04-09en_US
dc.identifier.issn0957-4484en_US
dc.identifier.urihttp://dx.doi.org/10.1088/0957-4484/21/14/145202en_US
dc.identifier.urihttp://hdl.handle.net/11536/5519-
dc.description.abstractWe have measured the intrinsic electrical resistivities, rho(T), of three individual single-crystalline ZnO nanowires (NWs) from 320 down to 1.3 K. The NWs were synthesized via carbon thermal chemical vapor deposition and the four-probe Pt contacting electrodes were made by the focused-ion-beam technique. Analysis of the overall temperature behavior of rho(T) confirms that the charge transport processes in natively doped ZnO NWs are due to a combination of the thermal activation conduction and the nearest-neighbor hopping conduction processes, as proposed and explained in a recent work (Chiu et al 2009 Nanotechnology 20 015203) where the ZnO NWs were grown by a different thermal evaporation method and the four-probe electrodes were made by the electron-beam lithography technique. Taken together, the observations of these two complementary studies firmly establish that the electrical conduction mechanisms in natively doped ZnO NWs are unique and now satisfactorily understood.en_US
dc.language.isoen_USen_US
dc.titleElectrical conduction mechanisms in natively doped ZnO nanowires (II)en_US
dc.typeArticleen_US
dc.identifier.doi10.1088/0957-4484/21/14/145202en_US
dc.identifier.journalNANOTECHNOLOGYen_US
dc.citation.volume21en_US
dc.citation.issue14en_US
dc.citation.epageen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.department物理研究所zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.contributor.departmentInstitute of Physicsen_US
dc.identifier.wosnumberWOS:000275652200008-
dc.citation.woscount11-
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