完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Hsieh, C. Y. | en_US |
dc.contributor.author | Chen, C. S. | en_US |
dc.contributor.author | Tsou, W. A. | en_US |
dc.contributor.author | Yeh, Y. T. | en_US |
dc.contributor.author | Wen, K. A. | en_US |
dc.contributor.author | Fan, L-S | en_US |
dc.date.accessioned | 2014-12-08T15:07:07Z | - |
dc.date.available | 2014-12-08T15:07:07Z | - |
dc.date.issued | 2010-04-01 | en_US |
dc.identifier.issn | 0960-1317 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1088/0960-1317/20/4/045017 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/5585 | - |
dc.description.abstract | A novel post-CMOS fabrication process has been developed to transform a 0.18 mu m 1P6M mixed-signal/RF CMOS (complementary metal oxide semiconductor)-integrated circuit chips fabricated on an 8 inch SOI (silicon-on-insulator) wafer into flexible devices sandwiched between biocompatible material (10 mu m parylene-C on both sides in this case) and enables future implementation of implantable and fully integrated electronic devices. The functionality of the flexible integrated circuits is demonstrated by a low phase noise RF CMOS VCO (voltage-controlled oscillator) circuit in a ring oscillator configuration that operates at a few hundred MHz to GHz. We report here the associated post-processing technology to make these flexible IC chips and the characterization of both MOS transistors and the demonstration circuit on the flexible IC chip under bending stresses. | en_US |
dc.language.iso | en_US | en_US |
dc.title | A flexible mixed-signal/RF CMOS technology for implantable electronics applications | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1088/0960-1317/20/4/045017 | en_US |
dc.identifier.journal | JOURNAL OF MICROMECHANICS AND MICROENGINEERING | en_US |
dc.citation.volume | 20 | en_US |
dc.citation.issue | 4 | en_US |
dc.citation.spage | en_US | |
dc.citation.epage | en_US | |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
顯示於類別: | 期刊論文 |