Title: | A CMOS 6-mW 10-bit 100-MS/s Two-Step ADC |
Authors: | Chung, Yung-Hui Wu, Jieh-Tsorng 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
Keywords: | Analog-digital conversion;calibration;comparators (circuits);subranging ADC;two-step ADC |
Issue Date: | 1-Nov-2010 |
Abstract: | A 10-bit 100-MS/s two-step ADC was fabricated using a 90 nm CMOS technology. To reduce power consumption, the ADC uses latch-type comparators for signal digitalization and an open-loop amplifier for residue amplification. The accuracy of the comparators is improved by offset calibration. The gain accuracy and the linearity of the residue amplifier are enhanced by digital background calibration. The ADC consumes 6 mW from a 1 V supply. Measured SNR and SFDR are 58.2 dB and 75 dB respectively. Measured ENOB is 9.34 bits. The FOM is 100 fJ . V per conversion-step. |
URI: | http://dx.doi.org/10.1109/JSSC.2010.2063590 http://hdl.handle.net/11536/5679 |
ISSN: | 0018-9200 |
DOI: | 10.1109/JSSC.2010.2063590 |
Journal: | IEEE JOURNAL OF SOLID-STATE CIRCUITS |
Volume: | 45 |
Issue: | 11 |
Begin Page: | 2217 |
End Page: | 2226 |
Appears in Collections: | Conferences Paper |
Files in This Item:
If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.