Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 吳聰志 | en_US |
dc.contributor.author | Tsung-Chin Wu | en_US |
dc.contributor.author | 李崇仁 | en_US |
dc.contributor.author | Chung-Len Lee | en_US |
dc.date.accessioned | 2014-12-12T02:12:07Z | - |
dc.date.available | 2014-12-12T02:12:07Z | - |
dc.date.issued | 1993 | en_US |
dc.identifier.uri | http://140.113.39.130/cdrfb3/record/nctu/#NT820430009 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/58005 | - |
dc.description.abstract | 利用對光罩式唯讀記憶體之故障模式的分析 ,可以將測試向量做 一 最佳 化的安排 , 以及早偵測出故障的晶片 , 減低測試時間 . The analysis of the failure modes of mask_ROM leads to the optimal test vectors flow plan to reduce test time . | zh_TW |
dc.language.iso | en_US | en_US |
dc.subject | 唯讀記憶體 , 故障 , 測試 . | zh_TW |
dc.subject | ROM , failure , test . | en_US |
dc.title | 基於光罩式唯讀記憶體架構之省時結構化測試法 | zh_TW |
dc.title | A Time_Saving Structural Testing Scheme For Mask_ROM | en_US |
dc.type | Thesis | en_US |
dc.contributor.department | 電子研究所 | zh_TW |
Appears in Collections: | Thesis |