| 標題: | 聚集性缺失發生在積體電路板製程上之研討 A study on clustered defects in manufacturing processes of integrated circuit industry |
| 作者: | 秦美惠 Qin, Mei Hui 洪志真 Hong, Zhi Zhen 統計學研究所 |
| 公開日期: | 1993 |
| URI: | http://140.113.39.130/cdrfb3/record/nctu/#NT822337007 http://hdl.handle.net/11536/58504 |
| 顯示於類別： | 畢業論文 |
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