聚集性缺失發生在積體電路板製程上之研討

Full metadata record

DC Field	Value	Language
dc.contributor.author	秦美惠	en_US
dc.contributor.author	Qin, Mei Hui	en_US
dc.contributor.author	洪志真	en_US
dc.contributor.author	Hong, Zhi Zhen	en_US
dc.date.accessioned	2014-12-12T02:12:47Z	-
dc.date.available	2014-12-12T02:12:47Z	-
dc.date.issued	1993	en_US
dc.identifier.uri	http://140.113.39.130/cdrfb3/record/nctu/#NT822337007	en_US
dc.identifier.uri	http://hdl.handle.net/11536/58504	-
dc.language.iso	en_US	en_US
dc.title	聚集性缺失發生在積體電路板製程上之研討	zh_TW
dc.title	A study on clustered defects in manufacturing processes of integrated circuit industry	en_US
dc.type	Thesis	en_US
dc.contributor.department	統計學研究所	zh_TW
Appears in Collections:	Thesis