| 标题: | 聚集性缺失发生在积体电路板制程上之研讨 A study on clustered defects in manufacturing processes of integrated circuit industry |
| 作者: | 秦美惠 Qin, Mei Hui 洪志真 Hong, Zhi Zhen 统计学研究所 |
| 公开日期: | 1993 |
| URI: | http://140.113.39.130/cdrfb3/record/nctu/#NT822337007 http://hdl.handle.net/11536/58504 |
| 显示于类别： | Thesis |
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