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dc.contributor.author鍾文杰en_US
dc.contributor.authorChung, Wen-Jyeen_US
dc.contributor.author虞孝成en_US
dc.contributor.authorHaiao-Cheng Yuen_US
dc.date.accessioned2014-12-12T02:14:57Z-
dc.date.available2014-12-12T02:14:57Z-
dc.date.issued1995en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#NT840230011en_US
dc.identifier.urihttp://hdl.handle.net/11536/60238-
dc.description.abstract本研究的對象是積體電路製程中的微影技術,對其現有功能與未來發展趨
勢進行分析,並 以個案研究的方式驗證KT式方法在微影製程機台評選之
應用可行性,建立了系統化的 機台評估方法。
研究的結果,在微影製程與其技術分析方面,可供業者作為參考;同時個
案研究部份的評 估方法與過程可運用在企業的經營與決策上,幫助業者
提昇經營的效率及降低決策錯誤的 風險。
This study researches the photolithography technology in IC
manufacturing process. Its function and technology
developing trend were analysed. Beside that, this study
verified the capability of KT method in lithographic mechanes'
evaluation by a case study. That built up a systematic method
for mechane selection.
The study result of photolithography process and its technology
analysis is useful to IC manufacturers. In the same time, the
evaluation procedure of case study can be applied to
companies' management. It helps managers to improve
their efficiency and reduces the risk of error-decision.
zh_TW
dc.language.isozh_TWen_US
dc.subject微影製程zh_TW
dc.subject趨勢分析zh_TW
dc.subjectKT式方法zh_TW
dc.subject技術評估zh_TW
dc.subjectPhotolithographyen_US
dc.subjectTrend analysisen_US
dc.subjectKT methoden_US
dc.subjectTechnology evalustionen_US
dc.title積體電路微影製程技術的趨勢分析與評估個案zh_TW
dc.titleA Trand Analysis and Evaluation Case Study for the Photolithography Technology in IC Manufacturing Processen_US
dc.typeThesisen_US
dc.contributor.department科技管理研究所zh_TW
Appears in Collections:Thesis