硫化錳鎘與硒化錳鋅薄膜製作及其特性研究

Full metadata record

DC Field	Value	Language
dc.contributor.author	蔡成宗	en_US
dc.contributor.author	Tsai, Cheng-Tzung	en_US
dc.contributor.author	褚德三	en_US
dc.contributor.author	Der-San Chuu	en_US
dc.date.accessioned	2014-12-12T02:17:39Z	-
dc.date.available	2014-12-12T02:17:39Z	-
dc.date.issued	1996	en_US
dc.identifier.uri	http://140.113.39.130/cdrfb3/record/nctu/#NT850429033	en_US
dc.identifier.uri	http://hdl.handle.net/11536/62069	-
dc.description.abstract	本論文主要用是利用脈衝式雷射蒸度法及濺鍍法製作CdMnS及ZnMnSe薄膜並探討其物理特性 This dissertation contains two main parts : thin films preparation and physical properties analysis.The first part is devoted to the studies on the thin films preparation of CdS, ZnSe, CdMnS, and ZnMnSe; the second part is devoted to the studies on the physical II-VI compound and diluted amgnetic semiconductor.	zh_TW
dc.language.iso	zh_TW	en_US
dc.subject	濺鍍	zh_TW
dc.subject	拉曼光譜	zh_TW
dc.subject	光激冷光	zh_TW
dc.subject	sputter	en_US
dc.subject	Raman spectra	en_US
dc.subject	PL	en_US
dc.title	硫化錳鎘與硒化錳鋅薄膜製作及其特性研究	zh_TW
dc.title	Fabrication and physical properties of CdMnS and ZnMnSe thin films.	en_US
dc.type	Thesis	en_US
dc.contributor.department	電子物理系所	zh_TW
Appears in Collections:	Thesis