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dc.contributor.author吳烈銘en_US
dc.contributor.authorWu, Leih-Mingen_US
dc.contributor.author王國禎en_US
dc.contributor.authorKuochen Wangen_US
dc.date.accessioned2014-12-12T02:18:49Z-
dc.date.available2014-12-12T02:18:49Z-
dc.date.issued1997en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#NT860394075en_US
dc.identifier.urihttp://hdl.handle.net/11536/62908-
dc.description.abstract在本論文中,我們提出一種基於貝氏正規表示式的自動測試程式產生器的 設計方法,此產生器可以自動產生適於X86相容微處理機之由簡單到複雜 的測試程式。我們首先說明自動測試程式產生器的設計要點。這些要點包 括自動測試程式產生器的使用者控制部分、分支指令處理、資料相依性測 試、指令共存需求、有限制的程式大小,以及資料快速記憶體測試。我們 採用編譯器設計之由上而下的遞迴下降剖析方法,來解決這些設計要點所 面對的問題,並實作出一個自動測試程式產生器。我們的自動測試程式產 生器不僅可以產生隨機測試程式,也能夠針對使用者之輸入檔案來對某一 個特定模組產生特定順序的一些指令。這些測試程式對X86相容微處理機 的驗證是非常有用的。此外,由自動測試程式產生器所產生出來的測試程 式有以下的特點:沒有無限迴圈、不會進入非法狀態、可控制的資料相依 性、有彈性的程式大小,以及資料快速記憶體可測試。我們對產生出來的 測試程式所做的實驗評估顯示,此自動測試程式產生器的設計方法是有效 率且可行的。 A BNF-based method to automatically generate test programs from simple to complex ones for X86 compatible microprocessors is presented in this thesis. Design issues for an automatic test program generator (ATPG) are firstoutlined. They are user menu- driven ATPG, branch handling, test fordata dependency, instructions appearing together requirement, bounded program size, and test for data cache. We have resolved these design issues and implemented an ATPG by a top-down recursive descent parsing method which was originated from compiler design. Our ATPG can produce not only random test programs but also a sequence of instructions for a specified module to be tested by specifying different user menu-driven files. These test programs are very useful for verification of X86 compatible microprocessors. In addition, test programs generated by our ATPG have the features of no infinite loop, not entering illegal states, controllable data dependency, flexible program size, and data cache testable. Experimental evaluation of our test programs indicate that our method is efficient and feasible for the development of an ATPG.zh_TW
dc.language.isozh_TWen_US
dc.subject自動測試程式產生器zh_TW
dc.subject貝氏正規表示式zh_TW
dc.subject相容性驗證zh_TW
dc.subject由上而下的遞迴下降剖析方法zh_TW
dc.subjectX86微處理機zh_TW
dc.subjectautomatic test program generatoren_US
dc.subjectBNFen_US
dc.subjectcompatibility verificationen_US
dc.subjecttop-down recursive descent parsing methoden_US
dc.subjectX86 microprocessoren_US
dc.titleX86相容微處理機驗證之自動測試程式產生器zh_TW
dc.titleAutomatic Test Program Generator for X86 Compatible Microprocessor Verificationen_US
dc.typeThesisen_US
dc.contributor.department資訊科學與工程研究所zh_TW
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