Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 黃國展 | en_US |
dc.contributor.author | Huang, Kuo-Chan | en_US |
dc.contributor.author | 李崇仁 | en_US |
dc.contributor.author | Lee Chung-Len | en_US |
dc.date.accessioned | 2014-12-12T02:18:56Z | - |
dc.date.available | 2014-12-12T02:18:56Z | - |
dc.date.issued | 1997 | en_US |
dc.identifier.uri | http://140.113.39.130/cdrfb3/record/nctu/#NT860428023 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/63005 | - |
dc.description.abstract | 本論文係研究有關數位電路設計測試之時序模擬、功率估算及最大化之諸 問題。首先本論文提出一新方法,可以有效地增加電路在熱加速測試之功 率消耗以達成熱加速測試之目的。再次,本論文也提出一編譯碼平行圖樣 之時序模擬器,藉由考慮邏輯閘之惰性延遲特性,以增進數位邏輯電路時 序模擬之速度與準確度。最後,將此一模擬器推廣應用至數位電路之功率 估算。首先,於增加熱加速測試功率上,本論文提出一方法,以其所產生 之權重隨機圖樣可以在熱加速測試期間儘可能地驅動電路。此一方法利用 兩種靈敏度量測(轉換傳遞靈敏度及功率權重靈敏度)及一最大化程序來獲 得輸入端之信號轉換機率分佈,並且根據所獲得之機率分佈來產生權重隨 機圖樣。特別是此一方法所產生之權重隨機圖樣可以有效地驅動電路內某 些特定選擇之薄弱節點,以期能夠激發這些節點之早期故障。實驗結果顯 示此一方法能增加整個電路的功率消耗最多可達26.68%,對於某些特定選 擇的節點則能增加多達41.51%之切換次數。藉由修改功率估算方法及功率 權重靈敏度計算,此一方法可推廣應用至序向電路。上述之最大化程序可 以被修改應用至最大功率消耗量的估算,其所得之結果優於以模擬一冗長 的隨機圖樣所獲得。再者,本論文提出一結合平行圖樣策略及惰性延遲模 型之編譯碼時序模擬器,得以準確而快速地完成電路之時序模擬。當比較 不同延遲模型的模擬實驗結果時發現,有高比例(約27%)的轉換會因為惰 性延遲的效應而被消去。由於此一模擬器利用平行圖樣策略,其執行速度 遠超過傳統的時間輪事件驅動模擬器。對於功率估算之應用,本論文提出 一機率式之方法來估算數位電路之功率消耗並且利用前述之時序模擬器來 比較其估算誤差。由於使用惰性延遲模型,此一方法可較為準確。根據邏 輯閘的真實行為,此一估算器將惰性延遲的效應轉變成一個轉換機率的消 減程序。由ISCAS電路的實驗結果顯示,此一功率估算方法優於前人的研 究。特別是對於大部份的大型電路,此一功率估算方法所產生之誤差低於 十個百分點。 This dissertation studies several topics on timing simulation, power estimation and maximization which concern design and test of digitalcircuits. First, this dissertation proposes a new approach which canmaximize power dissipation of the digital circuit during burn-in testing. Next, a compiled-code, parallel pattern timing simulator which takes account of inertial delays of logic gates to improve the speed and accuracy for timing simulation of digital circuits is presented. Finally, the simulator is applied to power estimation for digital circuits. First, for increasing power dissipation of burn-in testing, an approach to generate weighted random patterns which can maximally excite a circuit during its burn-in testing is proposed. This approach is based on two sensitivity measures, transition propagation sensitivity and power weight sensitivity, and a maximization procedure to obtain signal transition probability distribution for primary inputs. Then, weighted random patterns can be generated according to the obtained probability distribution. It can especially generate weighted random patterns to excite particularly selected "weak nodes" of the circuit in order to expose the early failure of these nodes. Experimental results show that this approach can increase power dissipation of the total circuit nodes up to 26.68% and switching activity of particularly selected nodes up to 41.51% respectively. The proposed approach can be applied to sequential circuits by modifying the power estimation method and the calculation of power weight sensitivity. The above maximization procedure is also modified to estimate the maximum power dissipation, i.e., the worst case power. The modified procedure generates a lower bound of the maximum power dissipation which cannot be obtained by just simulating long random sequences. For the compiled-code simulator, it incorporates the parallel pattern strategy and the inertial delay model. Due to incorporation of the inertial delay model, the timing simulation is more accurate. Experimental results show that a high percentage, i.e., 27%, of transitions which are simulated to occur for the conventional timing simulator should be eliminated. Also, since the simulator utilizes the parallel pattern strategy, experimental results show that it surpasses significantly over the conventional time wheel event-driven simulator in the simulation speed. For the application to the power estimation, a probability-based method with inertial delay model is proposed to estimate the power dissipation for digital logic circuit. Due to employing the inertial delay model, the approach is more accurate and the above developed simulator is used as to verify the estimation error for this approach. For the estimator, the effect of inertial delay is transformed into an elimination process of transition probabilities according to the actual behavior of logic gate.Experimental results on ISCAS benchmark circuits show that the proposed method is superior to the previous work. Especially, for majority of large benchmark circuits, the estimation error is below 10%. | zh_TW |
dc.language.iso | zh_TW | en_US |
dc.subject | 時序模擬 | zh_TW |
dc.subject | 功率估算 | zh_TW |
dc.subject | 功率最大化 | zh_TW |
dc.subject | 權重隨機圖樣 | zh_TW |
dc.subject | 惰性延遲模型 | zh_TW |
dc.subject | 熱加速測試 | zh_TW |
dc.subject | Timing Simulation | en_US |
dc.subject | Power Estimation | en_US |
dc.subject | Power Maximization | en_US |
dc.subject | Weighted Random Pattern | en_US |
dc.subject | Inertial Delay Model | en_US |
dc.subject | Burn-in Testing | en_US |
dc.title | 數位電路之時序模擬及其在功率估算與最大化之應用 | zh_TW |
dc.title | Timing Simulation and Its Applications to Power Estimation and Maximization for Digital Circuits | en_US |
dc.type | Thesis | en_US |
dc.contributor.department | 電子研究所 | zh_TW |
Appears in Collections: | Thesis |