標題: | Analytical Quantum-Confinement Model for Short-Channel Gate-All-Around MOSFETs Under Subthreshold Region |
作者: | Wu, Yu-Sheng Su, Pin 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
關鍵字: | Gate-all-around (GAA);MOSFET;quantum effects;short-channel effect |
公開日期: | 1-Nov-2009 |
摘要: | This paper presents an analytical model for quantum-confinement effects in short-channel gate-all-around (GAA) MOSFETs under the subthreshold region. Our analytical model accurately predicts the impact of short-channel effects and doping concentration on the quantum-confinement effects. This scalable quantum-confinement model is crucial to the ultrascaled GAA MOSFET design. |
URI: | http://dx.doi.org/10.1109/TED.2009.2030714 http://hdl.handle.net/11536/6471 |
ISSN: | 0018-9383 |
DOI: | 10.1109/TED.2009.2030714 |
期刊: | IEEE TRANSACTIONS ON ELECTRON DEVICES |
Volume: | 56 |
Issue: | 11 |
起始頁: | 2720 |
結束頁: | 2725 |
Appears in Collections: | Articles |
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