Comparison of p control charts for low defective rate

doi:10.1016/j.csda.2009.05.024

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DC 欄位	值	語言
dc.contributor.author	Wang, Hsiuying	en_US
dc.date.accessioned	2014-12-08T15:08:35Z	-
dc.date.available	2014-12-08T15:08:35Z	-
dc.date.issued	2009-10-01	en_US
dc.identifier.issn	0167-9473	en_US
dc.identifier.uri	http://dx.doi.org/10.1016/j.csda.2009.05.024	en_US
dc.identifier.uri	http://hdl.handle.net/11536/6598	-
dc.description.abstract	It is well known that the conventional p control chart constructed by the normal approximation for the binomial distribution suffers a serious inaccuracy in the monitor process when the true rate of nonconforming items is small. A similar problem also arises in the binomial confidence interval estimation. Adjusted confidence intervals are established in the literature to improve the coverage probability when the binomial proportion is small. In this paper, a new p control chart based on an adjusted confidence interval is established, which can substantially improve the existing control charts when the nonconforming rate is small. (C) 2009 Elsevier B.V. All rights reserved.	en_US
dc.language.iso	en_US	en_US
dc.title	Comparison of p control charts for low defective rate	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1016/j.csda.2009.05.024	en_US
dc.identifier.journal	COMPUTATIONAL STATISTICS & DATA ANALYSIS	en_US
dc.citation.volume	53	en_US
dc.citation.issue	12	en_US
dc.citation.spage	4210	en_US
dc.citation.epage	4220	en_US
dc.contributor.department	統計學研究所	zh_TW
dc.contributor.department	Institute of Statistics	en_US
dc.identifier.wosnumber	WOS:000270624600027	-
dc.citation.woscount	8	-
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