完整后设资料纪录
DC 栏位语言
dc.contributor.author吴奕文en_US
dc.contributor.authorYih-Wen Wuen_US
dc.contributor.author周长彬en_US
dc.contributor.authorChang Pin Chouen_US
dc.date.accessioned2014-12-12T02:23:52Z-
dc.date.available2014-12-12T02:23:52Z-
dc.date.issued1999en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#NT880489027en_US
dc.identifier.urihttp://hdl.handle.net/11536/66062-
dc.description.abstract摘要
铟基焊料,具有熔点低、高研展性及电磁传导性、热传导性佳的特性。本研究中,以软焊技术接合铜板。利用焊料对铜基材的润湿性,评估铟与铜的接合性。并对接合后原子间因扩散现象而于界面生成之介金属化合物,以不同的时效温度及时间加以处理后,研究其成长动力;探讨介金属化合物层之微观结构。设计实验,实际接合铜片,对试片施以剪力破坏,研究接合的品质。
实验结果发现加入不同成分比例的焊料,以铟锡合金对铜的接合性最佳,但其介金属化合物层成不规则之波浪状;纯铟及铟银合金焊料,则以平整的界金属化合物层,有较稳定均匀的接合品质。
zh_TW
dc.description.abstractABSTRACT
With the ongoing concern regarding environmental pollutants, lead is being targeted in industrial application. Compared with conventional lead solders, indium solders could improve the resistance thermal fatigue and alkaline corrosion. The addition of silver and tin into indium-based solder could suppress the melting point and improve wettability. A joint assembly of the Indium (In)-based solders/intermetallic compounds (IMCs)/copper substrate were prepared and experienced a thermal aging test for 20, 100, 200 and 400 hours at 80, 100 and 130℃, respectively. The interfacial diffusion and IMC formation of the assembly were investigated. The thickness of the IMC was measured using an optical microscope (OM).Scanning electron microscope (SEM),electron probe x-ray microanalyzer (EPMA), x-ray differactometer(XRD) technique were used to evaluate the interfacial microstructure. Shear tests were conducted with mechanical test frame run in stroke control mode.
Experimental results showed that the thickness of IMC formed by interfacial reaction was increased with the increase of the reaction temperature and the square root of reaction time. The phases in the microstructure of IMC are established. This study also made a comparison of the resistance of shear stress at each solder filler metal.
en_US
dc.language.isozh_TWen_US
dc.subject溅镀zh_TW
dc.subject软焊zh_TW
dc.subject润湿性zh_TW
dc.subject介金属化合物zh_TW
dc.subjectsputteringen_US
dc.subjectsolderingen_US
dc.subjectwettablityen_US
dc.subjectintermetallic compounden_US
dc.title无铅铟基焊料对铜接合之界面性质研究zh_TW
dc.titleEffect of Diffusion Intermetallics Formation between Lead-Free Indium Solder and Copper Substrateen_US
dc.typeThesisen_US
dc.contributor.department机械工程学系zh_TW
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