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dc.contributor.author陳正國en_US
dc.contributor.authorZheng-Guo Chenen_US
dc.contributor.author張國明en_US
dc.contributor.authorKow-Ming Changen_US
dc.date.accessioned2014-12-12T02:24:38Z-
dc.date.available2014-12-12T02:24:38Z-
dc.date.issued2005en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#GT009211580en_US
dc.identifier.urihttp://hdl.handle.net/11536/66523-
dc.description.abstract本篇論文中,我們將探討具有較厚源/汲極及較寬通道的新穎複晶矽薄膜電晶體結構的電性。從模擬的結果可知,電流可經由較寬的側向通道通過。因此我們研究具備側向通道的堆疊式結構的電性。我們發現飽和電流可以增加,同時漏電流也降低。除此之外,此種結構的製程只需要四道光罩。zh_TW
dc.description.abstractIn this thesis, we discuss the electrical characteristics of the novel structure of poly-Si TFTs with thick S/D and wider channel. From the simulated results, it can be seen that the drain current follow lines exist in the side channel region. We proposed the novel staggered structure with wider channel region and investigate the electrical properties. We find that the on-state current is increased and leakage current is decreased. In addition, the thick S/D region and a thin channel region could be achieved with only four mask steps.en_US
dc.language.isoen_USen_US
dc.subject薄膜電晶體zh_TW
dc.subject複晶矽zh_TW
dc.subject厚源/汲極zh_TW
dc.subject寬通道zh_TW
dc.subjectThin film transistorsen_US
dc.subjectpoly Sien_US
dc.subjectThick S/Den_US
dc.subjectwide Channelen_US
dc.title具有較厚源/汲極與較寬通道的多晶矽薄膜電晶體的模擬與電性分析zh_TW
dc.titleThe Simulations and Analysis of The Poly-Si Thin Film Transistor with Thicker S/D and wider Channelen_US
dc.typeThesisen_US
dc.contributor.department電子研究所zh_TW
Appears in Collections:Thesis


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