| 標題: | A Universal VLSI Architecture for ReedSolomon Error-and-Erasure Decoders |
| 作者: | Chang, Hsie-Chia Lin, Chien-Ching Chang, Fu-Ke Lee, Chen-Yi 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
| 關鍵字: | Error-and-erasure correction;Montgomery multiplication;Reed-Solomon (RS) code;universal architecture |
| 公開日期: | 1-九月-2009 |
| 摘要: | This paper presents a universal architecture for Reed-Solomon (RS) error-and-erasure decoder. In comparison with other reconfigurable RS decoders, our universal approach based on Montgomery multiplication algorithm can support not only arbitrary block length but various finite-field degree within different irreducible polynomials. Moreover, the decoder design also features the constant multipliers in the universal syndrome calculator and Chien search block, as well as an on-the-fly inversion table for calculating error or errata values. After implemented with 0.18-mu m 1P6M technology, the proposed universal RS decoder correcting up to 16 errors can be measured to reach a maximum 1.28 Gb/s data rate at 160 MHz. The total gates count is around 46.4 K with 1.21 mm silicon area, and the average core power consumption is 68.1 mW. |
| URI: | http://dx.doi.org/10.1109/TCSI.2008.2010143 http://hdl.handle.net/11536/6706 |
| ISSN: | 1549-8328 |
| DOI: | 10.1109/TCSI.2008.2010143 |
| 期刊: | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS |
| Volume: | 56 |
| Issue: | 9 |
| 起始頁: | 1960 |
| 結束頁: | 1967 |
| 顯示於類別: | 期刊論文 |

