完整後設資料紀錄
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dc.contributor.author趙傳珍en_US
dc.contributor.authorChuan-Jane Chaoen_US
dc.contributor.author陳 明 哲en_US
dc.contributor.author王 是 琦en_US
dc.contributor.authorMing-Jer Chenen_US
dc.contributor.authorShyh-Chyi Wongen_US
dc.date.accessioned2014-12-12T02:28:15Z-
dc.date.available2014-12-12T02:28:15Z-
dc.date.issued2001en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#NT900428134en_US
dc.identifier.urihttp://hdl.handle.net/11536/68822-
dc.description.abstract本論文針對矽技術積體電路之螺旋電感及傳輸線特性加以深入分析研究﹐首先﹐對單一螺旋電感之S參數、電感值及特性因子(Q)作完整的特性分析﹐並探討兩鄰近之共平面螺旋電感的信號耦合效應﹐最後﹐提出兩個新的等效電路模型來模擬前述的所有單一電感特性與兩鄰近之共平面螺旋電感的信號耦合效應。同時﹐我們也提出一些電感的設計改善方法﹐以提昇其Q的特性﹐並已驗證其可行性。其次﹐對傳輸線特性之分析研究﹐一個新的測試結構和方法已經被提出﹐並充分驗證其可行性及有效性﹐此測試方法是適用於決定傳輸線之一般電阻電容低頻模型的電性參數。對於高頻設計考量﹐這裡也討論並檢驗矽技術傳輸線之S參數測量、分析及相對應之參數萃取方法。zh_TW
dc.description.abstractThe characteristics of Si IC spiral inductors and transmission lines are analyzed. The complete characterization and new models of s-parameters, inductance value, and quality factor of a single spiral inductor, as well as coupling effect of coplanar spiral inductors are presented. Some enhancement methods by layout design are introduced and examined for improving the inductor performance. A novel methodology with correlative test structures is addressed for the determination of the conventional RC-based model regarding the interconnection parasitic parameters. Frequency-dependent characterizations and parameters extraction are carried out to investigate the Telegrapher’s equation in terms of transmission line model parameters (R, L, G, and C), loss, and coupling effects in silicon technologies.en_US
dc.language.isozh_TWen_US
dc.subject螺旋電感zh_TW
dc.subject傳輸線zh_TW
dc.subject耦合效應zh_TW
dc.subject高頻特性zh_TW
dc.subject高頻模型zh_TW
dc.subjectspiral inductoren_US
dc.subjecttransmission lineen_US
dc.subjectcoupling effecten_US
dc.subjecthigh-frequency characteristicen_US
dc.subjecthigh-frequency modelen_US
dc.title矽技術電感及傳輸線之特性分析, 設計及模型zh_TW
dc.titleAnalysis, Design, and Modeling of Inductor and Interconnect Transmission Line for Silicon Technologyen_US
dc.typeThesisen_US
dc.contributor.department電子研究所zh_TW
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