扭轉向列型液晶盒相對橢圓延遲片之等效

Abstract

本論文延續實驗室所發展的三個亮度之亮比式量測方法，量測各光學介質的橢圓參數。首先量測石英補波片的橢圓參數(光軸的偏光角，θ；相位角，δ；橢圓角，ε)，以驗證三點亮比式量測方法對橢圓參數量測之可行性。再以此量測方法量取扭轉式液晶 (TN-LC) 之液晶參數 (扭角ψ, 相位延遲 )，並進一步找出第一層液晶分子所對應之匹配角( C) 與參考座標的關係。最後由理論找出橢圓參數與液晶參數之間的關係，並以實驗量測將扭轉式液晶視為橢圓延遲片模式之等效參數。本文主要以一三量度量法量測一既非純線性雙折射也非純活性材料。

A three-intensity measurement technique is employed to a polarizer-sample-analyzer polarimetry. This work is trying to find the corresponding relationship between the elliptical retarder and the twisted Nematic liquid crystal (TN-LC). Since the optical active property of a quartz wave plate has been widely discussed, we consider the quartz quarter wave plate as a typical elliptical retarder, the azimuth angle of its optics axis (θ) , phase retardation (δ) and ellipse angle (ε) are measured by this polarimetry. By introducing the rubbing of the TN-LC, we are able to measure its azimuth angle position with respect to the reference zero. The twisted angle (ψ) and phase retardation ( ) of the TN-LC are also measured by this technique. The most important of this work is to consider the TN-LC as an elliptical retarder, its optical axis position, phase retardation and ellipse angle are measured by this technique. In this work, we measure a weak optical active medium (i.e. quartz) and a strong optical active medium (i.e. TN-LC), both of which are neither pure linear birefringence nor pure optical active medium.