標題: | Three-intensity measurement technique and its measurement in elliptical retarder |
作者: | Lin, P. L. Han, C. Y. Chao, Y. F. 光電工程學系 Department of Photonics |
關鍵字: | elliptical retarder;TN-LC cell;polarimetry |
公開日期: | 1-七月-2008 |
摘要: | A three-intensity technique is applied in polarimetry for measuring the physical parameters of an elliptical retarder. In this study, quartz and mica quarter wave plates are distinguished by two models: linear retarder and elliptical retarder. By considering the twist nematic liquid crystal cell as an elliptical retarder, we are able to relate the effective optic axis to its rubbing direction and twist angle. All its physical parameters can be deduced from the model. (C) 2008 Elsevier B.V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.optcom.2008.02.042 http://hdl.handle.net/11536/8648 |
ISSN: | 0030-4018 |
DOI: | 10.1016/j.optcom.2008.02.042 |
期刊: | OPTICS COMMUNICATIONS |
Volume: | 281 |
Issue: | 13 |
起始頁: | 3403 |
結束頁: | 3406 |
顯示於類別: | 期刊論文 |