標題: Three-intensity measurement technique and its measurement in elliptical retarder
作者: Lin, P. L.
Han, C. Y.
Chao, Y. F.
光電工程學系
Department of Photonics
關鍵字: elliptical retarder;TN-LC cell;polarimetry
公開日期: 1-Jul-2008
摘要: A three-intensity technique is applied in polarimetry for measuring the physical parameters of an elliptical retarder. In this study, quartz and mica quarter wave plates are distinguished by two models: linear retarder and elliptical retarder. By considering the twist nematic liquid crystal cell as an elliptical retarder, we are able to relate the effective optic axis to its rubbing direction and twist angle. All its physical parameters can be deduced from the model. (C) 2008 Elsevier B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/j.optcom.2008.02.042
http://hdl.handle.net/11536/8648
ISSN: 0030-4018
DOI: 10.1016/j.optcom.2008.02.042
期刊: OPTICS COMMUNICATIONS
Volume: 281
Issue: 13
起始頁: 3403
結束頁: 3406
Appears in Collections:Articles


Files in This Item:

  1. 000256573900002.pdf

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.