Three-intensity measurement technique and its measurement in elliptical retarder

doi:10.1016/j.optcom.2008.02.042

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DC 欄位	值	語言
dc.contributor.author	Lin, P. L.	en_US
dc.contributor.author	Han, C. Y.	en_US
dc.contributor.author	Chao, Y. F.	en_US
dc.date.accessioned	2014-12-08T15:11:16Z	-
dc.date.available	2014-12-08T15:11:16Z	-
dc.date.issued	2008-07-01	en_US
dc.identifier.issn	0030-4018	en_US
dc.identifier.uri	http://dx.doi.org/10.1016/j.optcom.2008.02.042	en_US
dc.identifier.uri	http://hdl.handle.net/11536/8648	-
dc.description.abstract	A three-intensity technique is applied in polarimetry for measuring the physical parameters of an elliptical retarder. In this study, quartz and mica quarter wave plates are distinguished by two models: linear retarder and elliptical retarder. By considering the twist nematic liquid crystal cell as an elliptical retarder, we are able to relate the effective optic axis to its rubbing direction and twist angle. All its physical parameters can be deduced from the model. (C) 2008 Elsevier B.V. All rights reserved.	en_US
dc.language.iso	en_US	en_US
dc.subject	elliptical retarder	en_US
dc.subject	TN-LC cell	en_US
dc.subject	polarimetry	en_US
dc.title	Three-intensity measurement technique and its measurement in elliptical retarder	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1016/j.optcom.2008.02.042	en_US
dc.identifier.journal	OPTICS COMMUNICATIONS	en_US
dc.citation.volume	281	en_US
dc.citation.issue	13	en_US
dc.citation.spage	3403	en_US
dc.citation.epage	3406	en_US
dc.contributor.department	光電工程學系	zh_TW
dc.contributor.department	Department of Photonics	en_US
dc.identifier.wosnumber	WOS:000256573900002	-
dc.citation.woscount	5	-
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