Full metadata record
DC FieldValueLanguage
dc.contributor.authorHong, Hao-Chiaoen_US
dc.contributor.authorLiang, Sheng-Chuanen_US
dc.contributor.authorSong, Hong-Chinen_US
dc.date.accessioned2014-12-08T15:09:23Z-
dc.date.available2014-12-08T15:09:23Z-
dc.date.issued2009-06-01en_US
dc.identifier.issn0923-8174en_US
dc.identifier.urihttp://dx.doi.org/10.1007/s10836-008-5095-xen_US
dc.identifier.urihttp://hdl.handle.net/11536/7167-
dc.description.abstractThis paper presents a built-in-self-test (BIST) I - pound Delta ADC prototype. The BIST circuity uses the proposed modified controlled sine wave fitting (CSWF) procedure to calculate the signal power and the total-harmonic-distortion-and-noise power in time domain separately. Compared with conventional Fast Fourier Transform (FFT) analysis, neither complex CPU/DSP nor bulky memory is required. The added BIST circuitry is purely digital and the hardware overhead is as low as 11.9 K gates. A prototype comprising the second-order design-for-digital-testability I - pound Delta modulator chip and an FPGA board which implements the digital functions is used to demonstrate the effectiveness of the BIST design. Measurement results show that the SNDR difference between conventional FFT analysis and the proposed BIST design of the standard -aEuro parts per thousand 6 dBFS, 1 KHz tone test is only 0.3 dB. Furthermore, the tested dynamic range values by both methods are the same. The proposed BIST implementation achieves the advantages of compact hardware, high test accuracy, and the flexibility of adjusting the stimuli which are important features for BIST applications.en_US
dc.language.isoen_USen_US
dc.subjectBISTen_US
dc.subjectSigma-Delta ADCen_US
dc.subjectControlled sine wave fittingen_US
dc.subjectOutput response analyzeren_US
dc.titleA Built-in-Self-Test I sigma-Delta ADC Prototypeen_US
dc.typeArticleen_US
dc.identifier.doi10.1007/s10836-008-5095-xen_US
dc.identifier.journalJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONSen_US
dc.citation.volume25en_US
dc.citation.issue2-3en_US
dc.citation.spage145en_US
dc.citation.epage156en_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:000266266700002-
dc.citation.woscount3-
Appears in Collections:Articles


Files in This Item:

  1. 000266266700002.pdf

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.