機體晶片低溫測試系統研製

Abstract

本論文是研究設計一種晶片可以進行低溫測試，利用現行半導體測試的分類機Handler，改造成可以測試低溫的環境，進而設計低溫環境所需要使用的儀器，此儀器包含致冷器、冷凍機、乾燥機、靜電消除器…等，而創造出來的環境又會衍生出低溫測試的問題，包含靜電及水氣問題，最後都有擬出可行的解決方案，達到低溫測試的目的。

This thesis is to design an IC chip can be tested at low temperatures , the use of the classification of the existing semiconductor testing machines Handler, transformed into a low temperature environment can be tested, then calculate and derive the low-temperature environment requires the use of instruments, this system contains refrigerator, freezer, drying machine, static eliminator ... etc., which can provide an environment for low temperature test and can solve the problems, including static change accumulation and moisture problems, and finally have a good solution to achieve low-temperature testing purposes.