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dc.contributor.authorWang, Wen-Chiehen_US
dc.contributor.authorHuang, Zue-Deren_US
dc.contributor.authorCarchon, Geerten_US
dc.contributor.authorMercha, Abdelkarimen_US
dc.contributor.authorDecoutere, Stefaanen_US
dc.contributor.authorDe Raedt, Walteren_US
dc.contributor.authorWu, Chung-Yuen_US
dc.date.accessioned2014-12-08T15:09:35Z-
dc.date.available2014-12-08T15:09:35Z-
dc.date.issued2009-05-01en_US
dc.identifier.issn1531-1309en_US
dc.identifier.urihttp://dx.doi.org/10.1109/LMWC.2009.2017611en_US
dc.identifier.urihttp://hdl.handle.net/11536/7330-
dc.description.abstractA 23 GHz electrostatic discharge-protected low-noise amplifier (LNA) has been designed and implemented by 45 nm planar bulk-CMOS technology with high-Q above-IC inductors. In the designed LNA, the structure of a one-stage cascode amplifier with source inductive degeneration is used. All high-Q above-IC inductors have been implemented by thin-film wafer-level packaging technology. The fabricated LNA has a good linearity where the input I dB compression point (IP(-1) (dB))is - 9.5 dBm and the input referred third-order intercept point (P(IIP3)) is +2.25 dBm. It is-operated with a I V power supply drawing a current of only 3.6 mA. The fabricated LNA has demonstrated a 4 dB noise figure and a 7.1 dB gain at the peak gain frequency of 23 GHz, and it has the highest figure-of-merit. The experimental results have proved the suitability of 45 nm gate length bulk-CMOS devices for PF ICs above 20 GHz.en_US
dc.language.isoen_USen_US
dc.subjectCMOSen_US
dc.subjectelectrostatic discharge (ESD) protectionen_US
dc.subject45 nmen_US
dc.subjectK -banden_US
dc.subjectlow-noise amplifier (LNA)en_US
dc.titleA 1 V 23 GHz Low-Noise Amplifier in 45 nm Planar Bulk-CMOS Technology With High-Q Above-IC Inductorsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/LMWC.2009.2017611en_US
dc.identifier.journalIEEE MICROWAVE AND WIRELESS COMPONENTS LETTERSen_US
dc.citation.volume19en_US
dc.citation.issue5en_US
dc.citation.spage326en_US
dc.citation.epage328en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000266069900024-
dc.citation.woscount3-
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