Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Shih, Che-Hua | en_US |
dc.contributor.author | Huang, Juinn-Dar | en_US |
dc.contributor.author | Jon, Jing-Yang | en_US |
dc.date.accessioned | 2014-12-08T15:09:35Z | - |
dc.date.available | 2014-12-08T15:09:35Z | - |
dc.date.issued | 2009-05-01 | en_US |
dc.identifier.issn | 1063-8210 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/TVLSI.2008.2006042 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/7333 | - |
dc.description.abstract | Verifying if an integrated component is compliant with certain interface protocol is a vital issue in component-based system-on-a-chip (SoC) designs. For simulation-based verification, generating massive constrained simulation stimuli is becoming crucial to achieve a high verification quality. To further improve the quality, stimulus biasing techniques are often used to guide the simulation to hit design corners. In this paper, we model the interface protocol with the non-deterministic extended finite-state machine (NEFSM), and then propose an automatic stimulus generation. approach based on it. This approach is capable of providing numerous biasing strategies. Experiment results demonstrate the high controllability and efficiency of our stimulus generation scheme. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Design automation | en_US |
dc.subject | generators | en_US |
dc.title | Automatic Verification Stimulus Generation for Interface Protocols Modeled With Non-Deterministic Extended FSM | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/TVLSI.2008.2006042 | en_US |
dc.identifier.journal | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | en_US |
dc.citation.volume | 17 | en_US |
dc.citation.issue | 5 | en_US |
dc.citation.spage | 723 | en_US |
dc.citation.epage | 727 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000265457700012 | - |
dc.citation.woscount | 0 | - |
Appears in Collections: | Articles |
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