TFT-LCD 內 Vcom 均勻度與液晶配向 PI 膜厚度變異的關係

Abstract

本論文研究之主題，主要是針對面板畫質–Flicker 現象做快速調整與分析，藉由自行開發的人機介面系統板與 CA-210 色彩量測分析儀連線，並透過玻璃大板的均一性分佈（Uniform Percentage, U%）進行分析，即可迅速統計出 TFT-LCD 內各種膜厚的變異關係。

此外，將玻璃大板另外區分成四分小板，可幫助釐清機台製造的偏差趨勢，且經 SEM 量測 PI 膜的厚度，即能對應出 Vcom 的偏移，幫助製程做修正，以達到高水準的出貨畫面品質。

In this thesis, CA-210 manufactured by Konika Minolta Optics has been used to measure the color components of TFT-LCDs . By driving a TFT-LCD panel with proper waveforms, flicker variations within the panel have been minimized by using an instrument to measure the flickes with automatic adjustments of Vcom . The measured variations of Vcom within four quadrants of the TFT-LCD panel have been correlated to the measured variations of the liquid-crystal alignment layers in that panel by SEM. The results have been applied to improve uniformity of liquid-crystal alignment layers in manufacture of TFT-LCD panels for low flickers and high-display quality .