Board-Level ESD of Driver ICs on LCD Panel

標題:	Board-Level ESD of Driver ICs on LCD Panel
作者:	Tseng, Jen-Chou Hsu, Chung-Ti Tsai, Chia-Ku Chen, Shu-Chuan Ker, Ming-Dou 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
關鍵字:	Charged-board model (CBM);electrostatic discharge (ESD)
公開日期:	1-三月-2009
摘要:	In this paper, a method utilizing a charged-device model (CDM) test by the tape carrier package or chip-on-film (COF) samples to emulate the real-world board-level CDM or charged-board model (CBM) electrostatic discharge is proposed for large-sized chips such as liquid-crystal display (LCD) driver ICs, which successfully duplicated the same failure by CBM discharging. For small-sized chips, the evaluation board (or printed circuit board) emulation should minimize the parasitic RLC loading of the interconnection on the board to achieve a more accurate CBM discharging. In addition, guidelines regarding chip-level design and layout optimization are proposed and have been successfully implemented to improve the immunity.
URI:	http://dx.doi.org/10.1109/TDMR.2008.2009931 http://hdl.handle.net/11536/7514
ISSN:	1530-4388
DOI:	10.1109/TDMR.2008.2009931
期刊:	IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Volume:	9
Issue:	1
起始頁:	59
結束頁:	64
顯示於類別：	期刊論文

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