標題: | New 4-Bit Transient-to-Digital Converter for System-Level ESD Protection in Display Panels |
作者: | Ker, Ming-Dou Yen, Cheng-Cheng 電機學院 College of Electrical and Computer Engineering |
關鍵字: | Converter;electromagnetic compatibility;electrostatic discharge (ESD);system-level ESD test;transient detection circuit |
公開日期: | 1-二月-2012 |
摘要: | A new on-chip 4-bit transient-to-digital converter for system-level electrostatic discharge (ESD) protection design is proposed. The proposed converter is designed to detect ESD-induced transient disturbances and transfer different ESD voltages into digital codes under system-level ESD tests. The experimental results in a 0.13-mu m CMOS integrated circuit with 1.8-V devices have confirmed the detection function and digital output codes. The proposed on-chip transient-to-digital converter can be code-signed with firmware operations to effectively enhance immunity of display systems against system-level ESD stresses. |
URI: | http://dx.doi.org/10.1109/TIE.2011.2157292 http://hdl.handle.net/11536/14877 |
ISSN: | 0278-0046 |
DOI: | 10.1109/TIE.2011.2157292 |
期刊: | IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS |
Volume: | 59 |
Issue: | 2 |
起始頁: | 1278 |
結束頁: | 1287 |
顯示於類別: | 期刊論文 |