完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Liu, Yen-Ming | en_US |
dc.contributor.author | Chang, Lon-Kou | en_US |
dc.date.accessioned | 2014-12-08T15:10:02Z | - |
dc.date.available | 2014-12-08T15:10:02Z | - |
dc.date.issued | 2009-02-01 | en_US |
dc.identifier.issn | 0278-0046 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/TIE.2008.2004392 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/7664 | - |
dc.description.abstract | In this paper, a novel single-stage soft-switching ac-dc converter for universal line applications is presented. Unlike the conventional single-stage designs, the proposed input-current shaping scheme is intentionally arranged to be charged in the duty-off time. With this design, the switch current stress in the duty-on time is significantly reduced. Meanwhile, this design produces ac modulation effect on the charging time of the boost inductor so that the input i-v curve drawn by the proposed converter has nearly linear relationship. Moreover, an active-clamp flyback-forward topology is used as the downstream de-de cell to alleviate voltage stress across the bulk capacitor. By deactivating the flyback subconverter and keeping the forward subconverter supplying the output power at light-load condition, the bulk-capacitor voltage can be alleviated effectively and guaranteed below 450 V in wide ranges of output load and line input (90-265 V(rms)). Experimental results, obtained from a prototype circuit with 20-V/100-W output, have verified that three achievements can be obtained simultaneously, including the compliance with the line-current harmonic regulations, the reliable alleviation of the bulk-capacitor voltage stress, and the substantially promoted conversion efficiency. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | AC-DC converter | en_US |
dc.subject | input-current shaping (ICS) | en_US |
dc.subject | single stage | en_US |
dc.subject | soft switching | en_US |
dc.title | Single-Stage Soft-Switching AC-DC Converter With Input-Current Shaping for Universal Line Applications | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/TIE.2008.2004392 | en_US |
dc.identifier.journal | IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS | en_US |
dc.citation.volume | 56 | en_US |
dc.citation.issue | 2 | en_US |
dc.citation.spage | 467 | en_US |
dc.citation.epage | 479 | en_US |
dc.contributor.department | 電控工程研究所 | zh_TW |
dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
dc.identifier.wosnumber | WOS:000263224900019 | - |
dc.citation.woscount | 30 | - |
顯示於類別: | 期刊論文 |