標題: 相位量測與三維掃描及其實驗驗證
Phase-measuring profilometry of 3D objects
作者: 吳忠穎
Zhong-Ying Wu
陳志隆
戴亞翔
Jyh-Long Chern
Ya-Hsiang Tai
顯示科技研究所
關鍵字: 相位量測;三維掃描;Phase-measuring;3-D profilometry
公開日期: 2005
摘要: 三維物體表面量測的應用廣泛,如產品檢測,不規則物體表面重建等。而如何可以快速量測而且精確是為首要目標。本論文研究是透過光柵投影在物體表面,量測相位的變化,去取得物體表面座標。並先以MATLAB數學模擬軟體,模擬實驗架構,分析此方法的誤差。最後完成實驗量測系統,比較模擬與實驗結果。我們釐清相位量測與三維掃描之關係,並完成實驗驗證。
The application of surface profile measurement is very extensive, such as product testing, reverse engineering, and so on, while how to make the measurement fast and accurate has been crucial. In this paper, we deduce the surface profile of a 3D diffuse object by measurement of the phase distribution across the image of a projected grating deformed by the surface. As a detailed evaluation, we first simulated the experimental structure by using MATLAB software, and explored possible error produced by the corresponding approach. Finally, we have built up the system, tested over different object forms, and compared the results with simulation. An effective phase-measuring profilometry of 3D objects has been realized through this thesis study.
URI: http://140.113.39.130/cdrfb3/record/nctu/#GT009315521
http://hdl.handle.net/11536/78607
顯示於類別:畢業論文