標題: 無線區域網路產品的可靠度分析與評估-以IEEE 802.11X基地台為例
A Field Case Study of Reliability Analysis & Evaluation of Wireless Local Area Network System (for IEEE 802.11X Access Point)
作者: 王順正
Shun-Cheng Wang
張起明
Chi-Min Chang
理學院應用科技學程
關鍵字: 無線區域網路基地台;可靠度;平均失效間隔時間;加速壽命試驗;失效模式分析;wireless LAN access point;reliability;mean time between failure(MTBF);accelerated life test;failure mode analysis
公開日期: 2005
摘要: 摘 要 隨著行動電腦與無線網路設備的普及化,人們對無線區域網路的依賴性日益增加,因而無線區域網路基地台的可靠度要求也相對提高。因為IEEE 802.11X WLAN AP是最廣泛使用於WLAN的無線區域網路基地台,所以本文針對開發階段的IEEE 802.11X無線區域網路基地台雛型機樣本,進行平均失效間隔時間的可靠度壽命預估與加速壽命試驗,將兩者結果進行比對以驗證實驗的合理性,並與零件表面熱分佈試驗進行失效模式分析,進而了解無線區域網路基地台的平均壽命與產品失效模式,且進一步分析無線網路基地台失效可能發生的原因,以供研發人員作為系統設計改善與零組件選用上的參考,以期提高無線區域網路基地台的可靠度,卑便提供大眾更完美的通訊服務品質。
Abstract The mobile computer & wireless local area network(WLAN) is very popular all over the world so far. And we believe that the wireless local area network access point (WLAN AP) and device equipment are key components to internet communication. The IEEE 802.11X wireless local area network access point (IEEE 802.11X WLAN AP) is widely used in WLAN communication. Therefore high reliability is required. This is a field case study of reliability for the mean time between failure (MTBF) of the IEEE 802.11X WLAN AP. We obtain the failure mode information and mean time between failure (MTBF) value via the accelerated life test result and thermal profiles test result of the IEEE 802.11X WLAN AP in prototype stage. And the testing result can be utilized as an important reference for engineers to improve the design and the components selection of IEEE 802.11X WLAN AP.
URI: http://140.113.39.130/cdrfb3/record/nctu/#GT009377506
http://hdl.handle.net/11536/80321
顯示於類別:畢業論文


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