標題: On the Mean Free Path for Backscattering in k(B)T Layer of Bulk Nano-MOSFETs
作者: Chen, Ming-Jer
Lu, Li-Fang
Hsu, Chih-Yu
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: Backscattering;MOSFET;nanoscale
公開日期: 1-十二月-2008
摘要: We perform Monte Carlo particle simulations on a silicon conductor for the purposes of reexamining the channel backscattering in bulk nano-MOSFETs. The resulting mean free path lambda(0) for backscattering in a long and near-equilibrium conductor is constant, regardless of the potential profile. However, the apparent mean free path lambda(1) in a local quasi-ballistic k(B)T layer depends on the curvature of the potential profile. In a linear potential profile, the lambda(1) extracted in a wide range of the conductor length (15 to 100 nm) and lattice temperature (150 to 300 K) is found to fall below lambda(0). The carrier heating as the origin of reduced mean free path is inferred from the simulated carrier velocity distribution near the injection point. Strikingly, the mean free paths in a parabolic potential profile remain consistent: lambda(1) = lambda(0) This indicates the absence or weakening of the carrier heating in the layer of interest, valid only for the parabolic potential barrier.
URI: http://dx.doi.org/10.1109/TED.2008.2006532
http://hdl.handle.net/11536/8069
ISSN: 0018-9383
DOI: 10.1109/TED.2008.2006532
期刊: IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume: 55
Issue: 12
起始頁: 3594
結束頁: 3598
顯示於類別:期刊論文


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