標題: | Critical thickness and orbital ordering in ultrathin La(0.7)Sr(0.3)MnO(3) films |
作者: | Huijben, M. Martin, L. W. Chu, Y. -H. Holcomb, M. B. Yu, P. Rijnders, G. Blank, D. H. A. Ramesh, R. 材料科學與工程學系 Department of Materials Science and Engineering |
公開日期: | 1-九月-2008 |
摘要: | Detailed analysis of transport, magnetism, and x-ray absorption spectroscopy measurements on ultrathin La(0.7)Sr(0.3)MnO(3) films with thicknesses from 3 to 70 unit cells resulted in the identification of a lower critical thickness for a nonmetallic nonferromagnetic layer at the interface with the SrTiO(3) (001) substrate of only three unit cells (similar to 12 angstrom). Furthermore, linear-dichroism measurements demonstrate the presence of a preferred (x(2)-y(2)) in-plane orbital ordering for all layer thicknesses without any orbital reconstruction at the interface. A crucial requirement for the accurate study of these ultrathin films is a controlled growth process, offering the coexistence of layer-by-layer growth and bulklike magnetic/transport properties. |
URI: | http://dx.doi.org/10.1103/PhysRevB.78.094413 http://hdl.handle.net/11536/8376 |
ISSN: | 1098-0121 |
DOI: | 10.1103/PhysRevB.78.094413 |
期刊: | PHYSICAL REVIEW B |
Volume: | 78 |
Issue: | 9 |
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顯示於類別: | 期刊論文 |