| 標題: | Ⅲ-Ⅴ族薄膜和晶格無缺陷技術在高頻、光電元件的應用及3D矽積體電路的整合(III) The Applications of Defect-Free Tech. and Materials of III-ⅤGroup in RF,Optical Electronic Devices and Integration in 3-D Si CMOS Circuits(III) |
| 作者: | 荊鳳德 CHIN ALBERT 國立交通大學電子工程學系及電子研究所 |
| 公開日期: | 2007 |
| 官方說明文件#: | NSC96-2221-E009-184 |
| URI: | http://hdl.handle.net/11536/88776 https://www.grb.gov.tw/search/planDetail?id=1470734&docId=263979 |
| Appears in Collections: | Research Plans |
- Ⅲ-Ⅴ族薄膜和晶格無缺陷技術在高頻、光電元件的應用及3D矽積體電路的整合(II) / 荊鳳德;CHIN ALBERT
- Ⅲ-Ⅴ族薄膜和晶格無缺陷技術在高頻、光電元件的應用及3D矽積體電路的整合(I) / 荊鳳德;CHIN ALBERT
- The integration of Ge and III-V materials on GaAs and Si for Post CMOS applications / Chang, Edward Yi;Chang, Chia Hua;Tang, Shih Hsuan;Hai Dang Trinh;Kuo, Chien I.
- The Materials Integration of Ge and InxGa1-xAs on Si Template for Next Generation CMOS Applications / Chang, Edward Yi;Tang, Shih-Hsuan;Lin, Yueh-Chin
- Design of Compact ESD Protection Circuit for V-Band RF Applications in a 65-nm CMOS Technology / Lin, Chun-Yu;Chu, Li-Wei;Tsai, Shiang-Yu;Ker, Ming-Dou
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