| 標題: | 奈米CMOS元件量子效應與電荷傳輸模擬及電性與可靠性分析(II) Nano-CMOS Charge Ballistic Transport, Quantum Effect, Characterization, and Reliability Study(II) |
| 作者: | 汪大暉 WANG TAHUI 交通大學電子工程系 |
| 公開日期: | 2005 |
| 官方說明文件#: | NSC94-2215-E009-009 |
| URI: | http://hdl.handle.net/11536/89962 https://www.grb.gov.tw/search/planDetail?id=1143851&docId=219368 |
| Appears in Collections: | Research Plans |
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