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DC 欄位語言
dc.contributor.authorHsieh, Hung-Chihen_US
dc.contributor.authorWu, Wang-Tsungen_US
dc.contributor.authorChang, Wei-Yaoen_US
dc.contributor.authorChen, Yen-Liangen_US
dc.contributor.authorSu, Der-Chinen_US
dc.date.accessioned2014-12-08T15:11:47Z-
dc.date.available2014-12-08T15:11:47Z-
dc.date.issued2011-04-01en_US
dc.identifier.issn0091-3286en_US
dc.identifier.urihttp://dx.doi.org/10.1117/1.3567172en_US
dc.identifier.urihttp://hdl.handle.net/11536/9028-
dc.description.abstractThe processes to derive the associated phase of an interference signal from the data of a series of recorded frames are performed, and we find that the sampling frequency being lower than the Nyquist sampling rate can also be applied to the full-field heterodyne interferometry. Two optimal sampling conditions for a commonly used CCD camera are proposed based on the relation between the heterodyne frequency and the contrast of the interference signal under the condition that the phase error is set to be 0.05 deg. (C) 2011 Society of Photo-Optical Instrumentation Engineers (SPIE). [DOI: 10.1117/1.356712]en_US
dc.language.isoen_USen_US
dc.subjectCCD cameraen_US
dc.subjectNyquist sampling rateen_US
dc.subjectfull-field heterodyne interferometryen_US
dc.subjectthree-parameter sine fitting algorithmen_US
dc.titleOptimal sampling conditions for a commonly used charge-coupled device camera in the full-field heterodyne interferometryen_US
dc.typeArticleen_US
dc.identifier.doi10.1117/1.3567172en_US
dc.identifier.journalOPTICAL ENGINEERINGen_US
dc.citation.volume50en_US
dc.citation.issue4en_US
dc.citation.epageen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000290028900026-
dc.citation.woscount1-
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