光學檢測機台之智慧型缺陷識別技術

標題:	光學檢測機台之智慧型缺陷識別技術 Intelligent Defect Recognition in an AOI Machine
作者:	林錫寬 LIN SHIR-KUAN 交通大學電機與控制工程系
公開日期:	2004
官方說明文件#:	NSC93-2622-E009-007-CC3
URI:	http://hdl.handle.net/11536/91215 https://www.grb.gov.tw/search/planDetail?id=1032770&docId=196923
Appears in Collections:	Research Plans

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