| Title: | 運用掃描式探針顯微鏡研製與分析矽奈米電子元件(II) Fabrication and Characterization of Silicon Nanoelectronic Devices with Scanning Probe Microscope(II) |
| Authors: | 許鉦宗 SHEU JENG TZONG 國立交通大學奈米科技研究所 |
| Issue Date: | 2004 |
| Gov't Doc #: | NSC93-2215-E009-080 |
| URI: | http://hdl.handle.net/11536/91236 https://www.grb.gov.tw/search/planDetail?id=1027499&docId=195424 |
| Appears in Collections: | Research Plans |
Files in This Item:
If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.
- 運用掃描式探針顯微鏡研製與分析矽奈米電子元件(III) / 許鉦宗;SHEU JENG TZONG
- Single-crystal silicon nanostructure fabrication by scanning probe lithography and anisotropic wet etching / Chang, KM;You, KS;Wu, CH;Sheu, JT
- Single-electron transistor structures based on silicon-on-insulator silicon nanowire fabrication by scanning probe lithography and wet etching / Sheu, JT;You, KS;Wu, CH;Chang, KM
- Special issue on nanoelectronics and nanoscale processing / Sheu, B;Wu, PCY;Sze, SM
- 矽質奈米級電子元件的研究 / 林建宏;Jian-Hong Lin;張國明;Kow-Ming Chang
- An alternative process for silicon nanowire fabrication with SPL and wet etching system / Chang, KM;You, KS;Lin, JH;Sheu, JT
Loading...