具應用性與優異性之晶圓針測排程問題演算法設計研究

標題:	具應用性與優異性之晶圓針測排程問題演算法設計研究 The Design of Algorithms with Applicability and Effectiveness for Solving the Wafer Probing Scheduling Problem (WPSP)
作者:	彭文理 WEN LEAPEARN 國立交通大學工業工程與管理學系
公開日期:	2000
官方說明文件#:	NSC89-2213-E009-163
URI:	http://hdl.handle.net/11536/92185 https://www.grb.gov.tw/search/planDetail?id=567039&docId=105524
Appears in Collections:	Research Plans

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