完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | 陳茂傑 | en_US |
dc.date.accessioned | 2014-12-13T10:34:35Z | - |
dc.date.available | 2014-12-13T10:34:35Z | - |
dc.date.issued | 2000 | en_US |
dc.identifier.govdoc | NSC89-2215-E009-029 | zh_TW |
dc.identifier.uri | http://hdl.handle.net/11536/92852 | - |
dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=528098&docId=96282 | en_US |
dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
dc.language.iso | zh_TW | en_US |
dc.subject | 銅化學氣相沈積 | zh_TW |
dc.subject | 孔槽填充技術 | zh_TW |
dc.subject | 銅介電材料系統之熱穩定性 | zh_TW |
dc.subject | 鉭基障礙層 | zh_TW |
dc.subject | 銅膜表面鈍化 | zh_TW |
dc.subject | Cu-CVD | en_US |
dc.subject | Via/trench filling | en_US |
dc.subject | Thermal stability of Cu/dielectric | en_US |
dc.subject | Ta-based barrier | en_US |
dc.subject | Passivation of Cu | en_US |
dc.title | 銅化學氣相沈積技術及積體電路銅製程相關的材料與製程技術研究 | zh_TW |
dc.title | Cu-CVD Technology and Reliability Issues of Cu Metallization Relevant to ULSI Application | en_US |
dc.type | Plan | en_US |
dc.contributor.department | 交通大學電子工程系 | zh_TW |
顯示於類別: | 研究計畫 |