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dc.contributor.author雷添福en_US
dc.contributor.authorLEI TAN-FUen_US
dc.date.accessioned2014-12-13T10:35:30Z-
dc.date.available2014-12-13T10:35:30Z-
dc.date.issued2001en_US
dc.identifier.govdocNSC90-2215-E009-070zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/93470-
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=665711&docId=126376en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.language.isozh_TWen_US
dc.subject閘極介電材料zh_TW
dc.subject清潔溶液zh_TW
dc.subject多晶矽薄膜zh_TW
dc.subject化學機械拋光zh_TW
dc.subject金氧半導體元件zh_TW
dc.subjectGate dielectric materialen_US
dc.subjectClean solutionen_US
dc.subjectPoly-silicon filmen_US
dc.subjectChemical mechanical polishing (CMP)en_US
dc.subjectMOS deviceen_US
dc.titleMOS元件之閘極層介電材料之技術開發與清潔溶液對複晶矽薄膜經化學機械研磨之研發zh_TW
dc.titleTechnology Development on Gate Dielectric for MOS Devices and Cleaning Solutions for Poly-Si Film after CMPen_US
dc.typePlanen_US
dc.contributor.department國立交通大學電子工程研究所zh_TW
顯示於類別:研究計畫


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