完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | 雷添福 | en_US |
dc.contributor.author | LEI TAN-FU | en_US |
dc.date.accessioned | 2014-12-13T10:35:30Z | - |
dc.date.available | 2014-12-13T10:35:30Z | - |
dc.date.issued | 2001 | en_US |
dc.identifier.govdoc | NSC90-2215-E009-070 | zh_TW |
dc.identifier.uri | http://hdl.handle.net/11536/93470 | - |
dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=665711&docId=126376 | en_US |
dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
dc.language.iso | zh_TW | en_US |
dc.subject | 閘極介電材料 | zh_TW |
dc.subject | 清潔溶液 | zh_TW |
dc.subject | 多晶矽薄膜 | zh_TW |
dc.subject | 化學機械拋光 | zh_TW |
dc.subject | 金氧半導體元件 | zh_TW |
dc.subject | Gate dielectric material | en_US |
dc.subject | Clean solution | en_US |
dc.subject | Poly-silicon film | en_US |
dc.subject | Chemical mechanical polishing (CMP) | en_US |
dc.subject | MOS device | en_US |
dc.title | MOS元件之閘極層介電材料之技術開發與清潔溶液對複晶矽薄膜經化學機械研磨之研發 | zh_TW |
dc.title | Technology Development on Gate Dielectric for MOS Devices and Cleaning Solutions for Poly-Si Film after CMP | en_US |
dc.type | Plan | en_US |
dc.contributor.department | 國立交通大學電子工程研究所 | zh_TW |
顯示於類別: | 研究計畫 |