矽晶絕緣層之雷射超音波檢測及評估(II)

標題:	矽晶絕緣層之雷射超音波檢測及評估(II) Evaluation of Silicon-on-Insulator by Wafer Bonding Using Laser-induced Ultrasound(II)
作者:	尹慶中 YIN CHING-CHUNG 國立交通大學機械工程學系
公開日期:	2000
官方說明文件#:	NSC89-2212-E009-091
URI:	http://hdl.handle.net/11536/93716 https://www.grb.gov.tw/search/planDetail?id=550510&docId=101701
Appears in Collections:	Research Plans

Files in This Item:

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.