標題: | 橢圓偏光儀之異向晶體量測 PSA Ellipsometric Measurements on Anisotropic Material |
作者: | 趙于飛 交通大學光電工程研究所 |
關鍵字: | 非等向性材料;橢圓偏光儀;雙折射晶體;Anisotropic material;Ellipsometry;Anisotropic crystal |
公開日期: | 1999 |
官方說明文件#: | NSC88-2112-M009-040 |
URI: | http://hdl.handle.net/11536/94263 https://www.grb.gov.tw/search/planDetail?id=418163&docId=74179 |
Appears in Collections: | Research Plans |
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