完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | 曾堅信 | en_US |
dc.date.accessioned | 2014-12-13T10:36:56Z | - |
dc.date.available | 2014-12-13T10:36:56Z | - |
dc.date.issued | 1999 | en_US |
dc.identifier.govdoc | NSC88-2215-E317-006 | zh_TW |
dc.identifier.uri | http://hdl.handle.net/11536/94269 | - |
dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=418159&docId=74178 | en_US |
dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
dc.language.iso | zh_TW | en_US |
dc.subject | 離子佈置 | zh_TW |
dc.subject | 淺接面 | zh_TW |
dc.subject | 介電材料 | zh_TW |
dc.subject | 隨機存取記憶體 | zh_TW |
dc.subject | 洩漏電流 | zh_TW |
dc.subject | 分凝 | zh_TW |
dc.subject | Ion implantation | en_US |
dc.subject | Shallow junction | en_US |
dc.subject | Dielectric material | en_US |
dc.subject | DRAM | en_US |
dc.subject | Leakage current | en_US |
dc.subject | Segregation | en_US |
dc.title | 離子佈植技術在淺接面製作及介電材料後處理之應用 | zh_TW |
dc.title | Applications of Ion Implantation on the Fabrication of Shallow Junctions and the Post-treatment of Dielectric Materials | en_US |
dc.type | Plan | en_US |
dc.contributor.department | 國立交通大學毫微米實驗室 | zh_TW |
顯示於類別: | 研究計畫 |