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dc.contributor.author吳世全en_US
dc.contributor.authorWU SHICH-CHUANen_US
dc.date.accessioned2014-12-13T10:36:56Z-
dc.date.available2014-12-13T10:36:56Z-
dc.date.issued1999en_US
dc.identifier.govdocNSC88-2215-E317-007zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/94273-
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=418231&docId=74196en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.language.isozh_TWen_US
dc.subject化學氣相沈積法zh_TW
dc.subject銅金屬連線zh_TW
dc.subject化學機械研磨zh_TW
dc.subject填塞率zh_TW
dc.subject覆蓋率zh_TW
dc.subject極大型積體電路zh_TW
dc.subjectCVDen_US
dc.subjectCopper metal interconnectionen_US
dc.subjectChemical mechanical polishingen_US
dc.subjectFilling rateen_US
dc.subjectConformalityen_US
dc.subjectULSIen_US
dc.title化學氣相沈積銅金屬之覆蓋率及填塞率之技術研究zh_TW
dc.titleImproving of Technology of Step Coverage and Filling Rate of CVD-Cu Metal in IC Fabricationen_US
dc.typePlanen_US
dc.contributor.department國立交通大學毫微米實驗室zh_TW
Appears in Collections:Research Plans